Abstract
CdZnTe thin films were deposited on FTO (SnO<sub>2</sub>: F)-coated glass substrates by close-spaced sublimation method and then annealed under three different conditions. The influences of the three thermal treatments on the structure, morphology, composition and optical properties of the CdZnTe thin films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy disperse spectra (EDS) and photoluminescence (PL) spectroscopy. The XRD results show that the films are (111) preferred orientation. The SEM and PL spectroscopy results show the better crystalline quality after any of three thermal treatments than that of as-deposited sample. The EDS analysis indicates that the Zn composition decreases for the sample with CdCl<sub>2</sub> annealing, but increases for the sample annealing directly and ZnCl<sub>2</sub> annealing. The same results are also obtained by XRD and PL spectroscopy.
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