Abstract
By using the transfer matrix method and the nearly free electron approximation, we investigate effects of interfacial roughness on electron transport through double-barrier quantum wells. The barrier roughness is described by the k-correlation model, and the interface is characterized by the roughness exponent, in-plane correlation length, and root mean square height. Our analysis demonstrates that the transmission probability is sensitive to roughness parameters. Two behaviors are observed for this sensitivity depending on whether the incident wavelength is larger or smaller than the correlation length.
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