Abstract
Sol-gel-derived lanthanum-modified lead zirconate titanate (PLZT) thin films with La/Zr/Ti ratios of 9.5/65/35, 15.5/40/60 and 18/30/70 were prepared on Corning 7059 glass substrates using a seeding layer [PLZT(14/0/100)]. The X-ray diffraction patterns and the microstructures of the films were investigated. The PLZT(9.5/65/35) thin films without the seeding layer consisted of both pyrochlore and amorphous phases. However the PLZT(9.5/65/35) thin films with the seeding layer showed preferred orientation as well as higher perovskite phase content. The orientation of the film varied with the thickness and the heat treatment of the seeding layer. The results will be discussed in terms of the effects of the seeding layer on the orientation and the content of the perovskite phase of the PLZT thin films on glass substrates.
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