Abstract
Crack-free YBa2Cu3Ox (YBCO) films were grown by liquid phase epitaxy (LPE) on MgO(100) substrates with a YBCO seed layer. The crystalline property of LPE was crucially dependent on that of the seed layer. On the purely c-axis-oriented seed layer, reasonable YBCO films were grown with a full-width at half maximum of the (005) reflection rocking curve, Δω, of 0.07°. In the case of the seed including an a-axis-oriented grain, the value of Δω of LPE films was poor in reproducibility and larger than 0.1° on average. For the a-axis-oriented seed, no YBCO films grew under the growth conditions in this study. X-ray topographic observations revealed that the crystalline quality of MgO substrates limited the Δω of LPE films grown on them.
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