Abstract
The effect of Pb excess on the crystallization and ferroelectric property in Pb(Zr0.3Ti0.7)O3 (PZT) thin films has been investigated. The Pb loss due to atomic interdiffusion and volatilization during thermal annealing has an impact on PZT stoichiometric composition, perovskite structure, and thus ferroelectric properties. The electrical characterization shows that the fatigue is closely correlated with the appropriate Pb content and temperature. With the aid of the fatigue model of concurrent pinning and depinning of domain walls under a repetitive bipolar pulse, we extract pinning and depinning coefficient dependences of the Pb excess and temperature.
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