Abstract
The temperature coefficient of resonant frequency (τf) and the structure of B-site deficient hexagonal perovskite materials have been assembled with the intention of understanding the structure-property relationship. Based on the refined structure data, the authors proposed a structure-related parameter v to characterize the octahedral thickness variance. Therefore, a correlation between the value of τf and the octahedral thickness variance has been established. This approach illustrates that the octahedral thickness variance plays an important role in the value and sign of τf. It also gives a satisfying explanation for the variation of τf in the Ba5Nb4O15–Ba5Ta4O15 system.
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