Abstract
AbstractThe effect of manufacturing artifacts on the performance of infrared frequency selective surfaces (FSS) is investigated in this article. For cross‐slot structures, these artifacts include slot length variation, slot width variation, the variation of spacing among elements, structural center broadening, and slot edge rounding. Quantitative measures of these effects on FSS transmission spectrum are obtained via a three‐dimensional (3D) periodic finite‐difference time‐domain method. The study shows that peak transmission intensity, resonant wavelength, and half‐max bandwidth of the transmission spectrum can be significantly affected by these manufacturing artifacts. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 1749–1754, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21752
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