Abstract

Using our transmission electron microscope (TEM) with operation energy of 200 kV, we have analyzed our melt texture growth (MTG) YBCO and BSCCO specimens by in situ electron beam irradiation. Taking TEM micrographs continuously with regular time intervals, we observed two interesting phenomena: annihilation of twin domains in the MTG YBCO film specimen and elimination of extinction contours of our MTG BSCCO specimen. A simple theory is presented here to calculate the minimum energy needed for twin domains to complete the annihilation process in the MTG YBCO specimen. On the other hand, we have estimated the force needed to change the buckled layer into a flat film under simple assumptions in the MTG BSCCO specimen. Such effect will contribute to the related industry in making better thin film device.

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