Abstract
We present generalizations of Bean critical state model to take into account granular effects as in high critical temperature superconductor ceramics. Both intragrain and intergrain critical current effect are discussed as they modify the “flux profile” determined by AC susceptibility measurements. We also examine the effect of Josephson weak links on the flux profile. We show how to obtain these electrical currents from the data together with the “granular fraction” and the flux penetration depth. Data on Bi 0.85Pb 0.15SrCa 1.2Cu 2O 6 sample is shown to be fitted to our theoretical expressions.
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