Abstract
We have extended our previous study on the electronic transport in metallic films to include the rough interface using the quantum statistical approach. The one-particle Green's function and the in-plane conductivity are calculated by taking into account both the quantum size effects and scattering processes resulting from bulk impurities, rough surfaces, and a rough interface. Our result shows that the conductivity is a sensitive function of interface roughness and decreases rapidly as the roughness increases. It is found that in the thin-film limit and in the lowest-order approximation of the surface and interface scatterings, the total conductivity is given by a sum of conductivities of all the subbands and the scattering rates for each subband due to the impurities, surfaces, and interface are additive.
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