Abstract
Using vector diffraction theory and an exact method for computing reflection coefficients for multilayer structures, we analyze the effects of high-numerical-aperture focusing on the state of polarization in optical data storage systems. The focused incident beam is decomposed into a spectrum of plane waves, and the reflected beam is obtained by the superposition of these plane waves after they are independently reflected from the multilayer. Plots of polarization rotation angle and ellipticity for several disk structures are presented.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
