Abstract
Giant dielectric constant ε′ of ∼(2.8–3.7)×104 was observed in high purity CuO (99.999%) ceramics with grain sizes of 4.57±1.71 and 9.57±3.01 μm. The ε′ and Ea increase with an increase in grain size due to the different electrical properties in the grains. The high dielectric response observed in the CuO ceramics can be described by the internal barrier layer capacitance model. The resistance of grain boundaries (Rgb) and the dielectric constant of the CuO samples decrease with increasing dc bias due to the decrease in grain boundaries capacitance, whereas the resistance of grains (Rg) remains constant.
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