Abstract

Ferromagnetic resonance measurements have been carried out on single crystal nickel films obtained by epitaxial evaporation onto NaF, LiF, NaCl and MgO substrates under various deposition conditions. It has been shown that electron bombardment of the substrate prior to and/or during deposition leads to differences in the nature of the excited resonance modes in the resonance spectra, in the linewidth and in the resonance field position, compared with otherwise similar deposition without electron bombardment. The study also indicates that the surface pinning at the film-substrate interface depends strongly on the nature of the substrate used and the bombardment time.

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