Abstract
The properties and viscosity-reduction mechanism of corn flour irradiated by electron beam have not been understood properly. Here, we investigate the effects of electron beam irradiation (EBI) on the gelatinization and physicochemical properties of corn flour irradiated by 0–5.40kGy of electron beam. The total starch and crude fiber contents of corn flour decreased significantly (P<0.05) after EBI treatment, while the moisture and reducing sugar contents increased significantly (P<0.05). EBI caused perforations on the corn flour particle surfaces, and the irradiated parts of the particles would gradually peel off and afford smooth surfaces, spherical structures, and smaller sizes. Molecular chains of corn flour broke owing to EBI. After irradiation, the pasting peak viscosity decreased dramatically (P<0.01) from 1251.74 to 7.16Pa·s, showing that the gelatinization of corn flour was completely inhibited. Thus, EBI can be used to inhibit the gelatinization of corn flour, which may be beneficial for industrial and food formulations.
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