Abstract
CuxSrBi8Ti6.88Nb0.12O27 (CuxSBTN0.12, x = 0, 0.2, 0.4, 0.6) intergrowth bismuth layer structure ferroelectrics (BLSFs) has been prepared by modified oxalate route. XRD analysis indicates the formation of pure intergrowth BLSF phase for all compositions. SEM micrograph shows a dense microstructure formation due to the addition of CuO and grain size decreases with Nb doping. The T c of the ferroelectrics remains same with Nb doping. The dielectric constant at Curie temperature increases with the increase in Nb doping. The conductivity of ceramics is found to increase with increasing Nb doping. The remnant polarization and coercive field of Cu0.2SBTN0.04 ceramics is highest among all compositions due to its largest grain size as well as the highest resistivity among all compositions.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
