Abstract
This study investigates the suppression of galvanic corrosion between copper and gold using cetyltrimethylammonium bromide (CTAB) and betaine as inhibitors. When copper is electrically connected to gold in PCB etching solutions, the substantial difference in their electrochemical potentials leads to the accelerated corrosion of copper, posing severe reliability risks. To mitigate this, we systematically investigated the galvanic corrosion inhibition properties of CTAB and betaine. Through comprehensive electrochemical analyses, it was found that the galvanic corrosion current density of copper, initially at 3.26 mA/cm2, decreased significantly to 0.251 mA/cm2 with 0.9 mM CTAB, indicating an inhibition efficiency of 92.3%. Furthermore, betaine, at a concentration of 0.1 mM, demonstrated an even higher inhibition efficiency, reducing the corrosion current to 0.03 mA/cm2, achieving a 99.1% inhibition rate. These findings provide strong evidence that CTAB and betaine are highly effective in suppressing galvanic corrosion in copper–gold systems, thereby enhancing the long-term performance and reliability of PCBs in electronic applications.
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