Abstract

Ferroelectric and ferroelastic domain structure has a profound effect on the piezoelectric, ferroelectric, and dielectric responses of ferroelectric materials. However, domain walls and strain field effects on thermal properties are unknown. We measured the thermal conductance from 100–400 K of epitaxially grown BiFeO3 thin films with different domain variants, each separated primarily by 71° domain walls. We determined the Kapitza conductance across the domain walls, which is driven by the strain field induced by the domain variants. This domain wall Kapitza conductance is lower than the Kapitza conductance associated with grain boundaries in all previously measured materials.

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