Abstract
LaNiO3 films with varying La:Ni ratios were deposited onto SrTiO3 (001) substrates via molecular beam epitaxy to elucidate the effects of cation off-stoichiometry. The physical properties of La-deficient films are found to differ substantially from those of Ni-deficient films, with La-deficient films exhibiting lower electrical resistivities and smaller c-axis parameters than Ni-deficient films. No evidence of secondary phases is observed; however, transmission electron microscopy reveals an abundance of defects, the nature of which differs in lanthanum- and nickel-deficient films. This work illustrates the nontrivial role that cation stoichiometry can play on the functional properties of complex oxides.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
