Abstract
Quaternary sputtering without additional selenization is a low-cost alternative method for the preparation of Cu(InGa)Se2 (CIGS) thin film for photovoltaics. However, without selenization, the device efficiency is much lower than that with selenization. To comprehensively examine this problem, we compared the morphologies, depth profiles, compositions, electrical properties and recombination mechanism of the absorbers fabricated with and without additional selenization. The results revealed that the amount of surface Se on CIGS films annealed in a Se-free atmosphere is less than that on CIGS films annealed in a Se-containing atmosphere. Additionally, the lower amount of surface Se reduced the carrier concentration, enhanced the resistivity of the CIGS film and allowed CIGS/CdS interface recombination to be the dominant recombination mechanism of CIGS device. The increase of interface recombination reduced the efficiency of the device annealed in a Se-free atmosphere.
Highlights
In the industrial production of Cu(InGa)Se2 (CIGS) photovoltaic devices, absorbers are usually produced by a two-step process comprising sputter deposition of a Cu-In-Ga alloy precursor, followed by post-selenization and sulfurization [1,2]
The results revealed that the amount of surface Se on CIGS films annealed in a Se-free atmosphere is less than that on CIGS films annealed in a Se-containing atmosphere
The surface and cross-sectional morphologies of CIGS films annealed in Se-free and Se-containing atmospheres are shown in figure 1a and b, respectively
Summary
In the industrial production of Cu(InGa)Se2 (CIGS) photovoltaic devices, absorbers are usually produced by a two-step process comprising sputter deposition of a Cu-In-Ga alloy precursor, followed by post-selenization and sulfurization [1,2]. Sputtering has great advantages when the technology is transferred from laboratory-scale solar cells to production-scale panels, because it produces large-area film homogeneity [3,4,5]. The efficiency of a solar cell prepared in a Se-free atmosphere is far less than those prepared in a Se-containing annealing atmosphere. The limiting factor of the low efficiency in devices made in a Se-free atmosphere is attributed to the quality of the absorber and CIGS–CdS interfacial matching. To explore the effect of annealing atmosphere on the device performance, the morphologies, elemental depth profiles, quantitative compositions, electrical properties, and recombination mechanisms of the device are analysed
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
