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https://doi.org/10.1109/ats.2002.1181683
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Cite Publication Date: Nov 18, 2002 |
 Citations: 3 |
Affiliation: Advantest (Japan), University of Washington
This paper presents an experimental study of random jitter modulation in a commercial serializer-deserializer device to demonstrate the effects of possible amplitude modulation in jitter tolerance measurements. The paper recommends alternative methods for injecting random jitter to avoid this source of measurement error.
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