Abstract
For some years, the IR laboratory of Onera (Office National des Etudes et Recherches Aéros-natiales) has carried out accurate electro-optical characterisation on IR detectors. This paper presents some work on IR detector radiation hardness measurements. Onera, in collaboration with DGA/CEG (Centre d’Etudes de Gramat), measured the effects of γ radiation on long wavelength IRCMOS. The test conditions satisfy operational constraints, particularly, during the radiation, detectors were cooled and operating. This paper reviews the results of component behaviour for dose rate from 10 7 to 10 10 rad/s. The transient and permanent effects are presented.
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