Abstract
We studied the effective electrical conductivity of dense random resistor networks (RRNs) produced using a Voronoi tessellation when its seeds are generated by means of a homogeneous Poisson point process in the two-dimensional Euclidean space. Such RRNs are isotropic and in average homogeneous; however, local fluctuations of the number of edges per unit area are inevitable. These RRNs may mimic, e.g., crack-template-based transparent conductive films. The RRNs were treated within a mean-field approach. We found an analytical dependency of the effective electrical conductivity on the number of conductive edges (resistors) per unit area, nE. The effective electrical conductivity is proportional to nE when nE≫1.
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