Abstract
Effective area of guarded electrode is always larger than its geometrical area as a result of fringing effect. In most standards concerning permittivity and volume resistivity measurements, an increase in the effective fringing is assumed as a half of the width of the gap between the guarded electrode and the guard electrode (then the factor B = 1). In some standards, the increase calculated from Amey relation, is assumed to be smaller (B < 1). The Amey relation is exact only for sample permittivity epsivrarrinfin . It is correct to apply the relation to calculate the volume resistivity, but it is incorrect to use it to calculate the permittivity of a sample. In this paper, a proper relation for the factor B has been derived analytically for thin electrodes made usually by thin film technology. The factor B can be used to calculate the permittivity of samples with arbitrary value of epsiv. Appropriate changes into the standard IEC 60250 and into other standards concerning permittivity measurements are proposed.
Published Version
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