Abstract

Development of very high speed integrated circuits is currently of great interest for today's technologies. This paper presents the quasi–TEM approach for accurate parameter extraction of multiconductor transmission line interconnects in single–, two– and three–layered dielectric regions using the Finite Element Method (FEM). We illustrate that FEM is accurate and effective for modelling multilayered multiconductor transmission lines in strongly inhomogeneous media. We mainly focus on designing of five transmission lines embedded in single–, two– and three–layered dielectric media. We compute the capacitance matrices for these configurations. We also determine the quasi–TEM spectral for the potential distribution of the multiconductor transmission lines in multilayer dielectric media.

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