Effect of voltage on structure and properties of 2024 aluminum alloy surface anodized aluminum oxide films

Abstract

In this study, anodized aluminum oxide (AAO) films were fabricated in situ on the surface of a high-strength and robust 2024 aluminum alloy using step voltage and constant voltage modes, respectively. Our study included examination of the microstructure, thickness, microhardness, and electrochemical characteristics of the AAO films. Cross-sectional morphology analysis revealed that the AAO film produced via the step-voltage approach exhibited remarkable density, uniformity, and good quality. In contrast, conspicuous cracks were observed in the AAO film generated under constant-voltage conditions when applied to the 2024 aluminum alloy substrate. Notably, the microhardness of the AAO film prepared using the step voltage method surpassed that of its constant-voltage counterpart. Specifically, the microhardness of the AAO film produced at 30 V via the step voltage reached 289 HV, whereas the equivalent AAO film produced at a constant voltage of 30 V registered only 174 HV. Furthermore, the self-corrosion potential and polarization resistance of the AAO films created using the step voltage were markedly higher than those achieved using a constant voltage. Specifically, the AAO films produced under step voltage conditions, specifically at 30 V and 60 min, exhibited the highest self-corrosion potential and polarization resistance values of namely −0.52 V and 34,888.6 Ω, respectively. In contrast, AAO films prepared under constant voltage conditions displayed values of −0.61 V and 23,292.0 Ω, respectively. Conducting AC impedance measurements and subsequent fitting calculations, the maximum thickness of the AAO film generated via step voltage and constant voltage methods amounted to 132.43 nm and 106.70 nm, respectively. Overall, the microstructure and corrosion resistance of the AAO film formed on the surface of the 2024 aluminum alloy using the step voltage approach demonstrated that it outperformed that of the AAO layer prepared under constant-voltage conditions.Chinese library classification number:TG178 Document ID:A Article ID.