Abstract
RO - Al 2 O 3- B 2 O 3- SiO 2( R = Ca , Mg ) glasses containing different concentrations of TiO 2 (ranging from 0 to 9 mol.%) were prepared by conventional melting method. When TiO 2 was present in lower concentrations (≤ 6 mol.%), Fourier-transform infrared spectroscopy (FTIR) indicated that titanium ions took part in network forming positions. However, for further increase in the concentration of TiO 2 (> 6 mol.%), FTIR data indicated the formation of TiO 4 tetrahedrons and TiO 6 octahedrons. The glass transition temperatures (Tg) were determined using a differential scanning calorimetry (DSC). The Tg variation with the concentration of TiO 2 showed an increasing trend up to 6 mol.% of TiO 2 and beyond this concentration, Tg was found to decrease. The dielectric constant εr and loss tan δ continued to decrease with the concentration of TiO 2 up to 6 mol.% and beyond that εr and tan δ were found to increase. This behavior was mainly explained in terms of the rigidity of glass network.
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