Abstract
We report the effect of thickness on the structural, morphological, transport and magnetic properties of perovskite oxide La0.85Te0.15MnO3 thin films grown on LaAlO3 (001) single crystal substrate by pulsed laser deposition. We have observed that the transport and magnetic properties of the films depend on the film thickness, surface morphology, and epitaxial strain. The films were characterized by x-ray diffraction that confirms that the films have good crystalline quality, single phase and c-axis orientation. The Atomic force microscopic (AFM) results show that surface roughness and average grain size increase with film thickness. The resistivity measurements show an insulator to metal transition that correlates well with the magnetic ordering temperature. X-ray photoemission spectroscopy measurements suggests that Te ions are in the Te4+ state, while the Mn ions stay in the Mn2+ and Mn3+ valence states.
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