Abstract
We report the structural, morphological and magneto-transport properties of electron doped La0.85Te0.15MnO3 (LTMO) thin film grown on (001) LaAlO3 single crystal substrate by pulsed laser deposition (PLD). X-ray diffraction (XRD) results confirm that the film has good crystalline quality, single phase, and c-axis orientation. The atomic force microscopy (AFM) results have revealed that the film consists of grains with the average size in a range of 20–30 nm and root-mean square (rms) roughness of 0.27nm. The resistivity versus temperature measurement exhibits an insulator to metal transition (MIT). We have noticed a huge value of magnetoresistance (∼93%) close to MIT in presence of 8T field. X-ray photoemission spectroscopy confirms the electron doping and suggests that Te ions could be in the Te4+ state, while the Mn ions stay in the Mn2+ and Mn3+ valence state.
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