Abstract
The purpose of this paper is to study the two dimensional deformation in a semi-infinite semiconducting medium. The deformation is caused subjected to a mechanical force applied along the interface of elastic layer of thickness h and a semiconducting medium. Normal Mode analysis has been used to obtain the exact expression of normal displacement, normal force stress, temperature distribution and carrier density. The effect of this force and thermoelectric coupling parameter on the displacement component, force stress, temperature distribution and carrier density has been depicted graphically.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
