Abstract
Abstract Effects of the oxide substrate on the nickel (Ni) particle properties are examined by using a Ni agglomeration behavior analysis and Kelvin Force Microscope (KFM) technique. Agglomerated Ni particles are formed after annealing a Ni thin film on oxide substrates of yttria stabilized zirconia (YSZ) and gadolinia doped ceria (GDC). Nickel agglomeration is suppressed for the Ni particles on the GDC substrate compared to those particles on the YSZ substrate. Although evaluated at room temperature, the surface potential of GDC is more positive than that of YSZ, while Ni particle surface potential is about the same for both the Ni/YSZ and the Ni/GDC systems.
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