Abstract
Cu2ZnSnS4 (CZTS) thin films were successfully prepared by magnetron sputtering. The composition, phase structure, surface morphology and optical properties of the CZTS thin films were characterized by X-ray diffraction, Raman spectroscopy, scanning electron microscopy (SEM) and ultraviolet visible spectrophotometer (UV-VIS). The result shows that: when the sulfurization time was 15 minutes, the atomic ratio was closed to the stoichiometric ratio of CZTS thin films, and the surface morphology of the film was homogeneous and compacted with the good uniformity. The grown films exhibit strong preferential orientation along (112) plane. As-obtained CZTS films have obvious absorptions under the visible light, and after the sufficient sulfurization, the band gap remains constant with the increase of sulfurization time.
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