Effect of structure and orientation of incident carbon-cluster ions Cn+(n≤4) on secondary-ion emission induced by electronic excitation

Abstract

We present experimental results that show the secondary-ion yield depends on the structure and orientation of incident cluster ions. A beam of carbon-cluster ions ${{\mathrm{C}}_{n}}^{+}$ ($n\ensuremath{\le}4$) with an energy of 0.9 MeV per atom, which were obtained from a tandem electrostatic accelerator, was incident on a glycine target deposited on a carbon foil. The structure and orientation of the cluster ions after passing through the target were determined by the Coulomb explosion imaging method, and the positive secondary ions were simultaneously measured by time-of-flight mass spectrometry. When looking at the orientation dependence of linear structured ${{\mathrm{C}}_{2}}^{+}, {{\mathrm{C}}_{3}}^{+}$, and ${{\mathrm{C}}_{4}}^{+}$ projectiles, parallel orientations with respect to the beam direction were found to enhance the secondary-ion yield compared with perpendicular orientations. Additionally, comparison of the structure dependence of ${{\mathrm{C}}_{3}}^{+}$ and ${{\mathrm{C}}_{4}}^{+}$ projectiles with linear and ring structures showed that the secondary-ion yield was larger for linear structures. Interestingly, there was a clear correlation between the secondary-ion yield and the deposited energy density in the cluster-ion track. The energy density was calculated with electronic stopping power for incident cluster ions using linear-response dielectric theory and the cross section of the track of the incident cluster considering its geometrical structure and orientation. These results suggest that the deposited energy density in the cluster-ion track is a key parameter in the secondary-ion emission process induced by swift cluster-ion impacts.