Effect of step decoration on the spin reorientation of Ni films grown on vicinal Cu(001)

Abstract

Ultrathin Ni films are grown on vicinal Cu(001) substrate with the steps parallel to the [110] axis and with the vicinal angle ranging from 0\ifmmode^\circ\else\textdegree\fi{} to 12\ifmmode^\circ\else\textdegree\fi{}. Spin reorientation transition (SRT) thickness of the Ni film is studied in situ using magneto-optic Kerr effect with step decoration of Mn, Fe, Co, Cu, and Pd. Surprisingly, the Ni SRT thickness is only affected by the Co step decoration with the other elements having little effect on the Ni SRT thickness. Further experiment using Co normal growth and a thin separation Cu layer confirms that the affected Ni SRT by the Co decoration comes from the Ni-Co interaction at the step edges.