Abstract
Refractive index resolution is an important indicator for a wavelength interrogation surface plasmon resonance sensor, which can be affected by signal-to-noise ratio. This paper investigates the impact of spectral signal-to-noise ratio on a surface plasmon resonance sensor. The effects of different spectral powers and noises are compared and verified through simulation and experiments. The results indicate that the optimal resonance wavelength is changed and the refractive index resolution can even be nearly twice as good when the spectral signal-to-noise ratio is increased. The optimal resonance wavelength can be found by changing the spectral power distribution or noise.
Highlights
Spectral Signal-to-Noise Ratio on Surface plasmon resonance (SPR) has been widely used in drug screening [1,2], biochemical safety [3], food safety [4], environmental monitoring [5], utilization of solar energy [6,7,8], and other fields [9,10] in the last twenty years
The optimal resonance wavelength and the measurement was taken near the optimal resonance wavelength position to was imfound,the and the measurement was of taken theThe optimal resonance wavelength position prove reliability and accuracy the near results
The optimal resonance wavelength and the optimal resolution were obtained at two integration times
Summary
Spectral Signal-to-Noise Ratio on Surface plasmon resonance (SPR) has been widely used in drug screening [1,2], biochemical safety [3], food safety [4], environmental monitoring [5], utilization of solar energy [6,7,8], and other fields [9,10] in the last twenty years. According to the interrogation method, the SPR system can be divided into angle interrogation [15], phase interrogation [16], amplitude interrogation [17], and wavelength interrogation [18]. Finding the optimal resonance wavelength is an important basis to determine the working spectral band. The spectral signalto-noise ratio (SNR) can affect the determination of the optimal resonance wavelength
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