Abstract

For wavelength interrogation based surface plasmon resonance (SPR) sensors, refractive index (RI) resolution is an important parameter to evaluate the performance of the system. In this paper, we explore the influence of spectral power distribution on the refractive index (RI) resolution of the SPR system by simulating the reflectivity curve corresponding to the different incident angles of the classical Kretschmann structure and several different spectral power distribution curves. A wavelength interrogation based SPR system is built, and commercial micro-spectrometers (USB2000 and USB4000) are used as the detection components, respectively. The RI resolutions of the SPR system in these two cases are measured, respectively. Both theoretical and experimental results show that the spectral power distribution has a significant effect on the RI resolution of the SPR system.

Highlights

  • Surface plasmon resonance (SPR) is the resonant oscillation of conduction electrons at the interface between the noble metal and dielectric stimulated by the incident light [1]

  • We have explored the effect of the spectral power distribution on the refractive index (RI) resolution

  • It is due to the difference of the spectral power distribution that the RI resolution is different

Read more

Summary

Introduction

Surface plasmon resonance (SPR) is the resonant oscillation of conduction electrons at the interface between the noble metal and dielectric stimulated by the incident light [1]. Because of the rapid enhancement of electromagnetic fields near the metal structure, SPR based optical sensors are exceedingly sensitive to small changes in the refractive index (RI) of the metal interface and have the capability of label-free real-time sensing [2]. According to different detection methods, SPR sensors can be divided into four types: wavelength interrogation, angle interrogation, intensity interrogation, and phase interrogation. Wavelength interrogation based SPR sensors have great advantages over the other interrogation methods of SPR sensors, such as miniaturization, SPR imaging technology [8], multi-channel [9], and multi parameter measurement. Wavelength interrogation based SPR sensors, called spectral SPR sensors, use spectrometers as detectors, which

Methods
Results
Discussion
Conclusion

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.