Abstract
Crystal structure, surface morphology, surface chemical composition and photocurrent response curves of the thin films were investigated by X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy and electrochemical workstation. The results show that the composite thin films are composed of CuO and Cu2O phase. The relative content of copper (I) oxide on the composite thin films increases with the increase of solution concentration. Leaf-like CuO particles have been observed on the thin film grown in the 0.5 mol/L solution. Some regular octahedral and truncated octahedral Cu2O particles have been observed on the surface of thin films grown in the 0.6 and 0.8 mol/L solution, respectively. The best photocurrent response and the fastest growth and decay have been observed in the thin film grown in 0.6 mol/L solution.
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