Abstract
Effect of sample sizes in electromagnetic wave emission from intrinsic Josephson junctions is investigated numerically. By using material parameters of Bi2Sr2CaCu2O8, emission frequency becomes as large as 1THz for a few dozens of layers. Frequencies at intensity peaks can be described well as the in-phase cavity resonance of transverse plasma. As the sample width increases, peak intensity gradually increases and then saturates. When the width exceeds a critical size, intensity peak becomes almost flat and such plateau region broadens as the width further increases. These behaviors can be explained by the mixing of two nearby cavity modes.
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