Abstract
The evolution of near-edge X-ray absorption fine structure in the vicinity of the K-absorption edge of oxygen for HfO2 over a wide range of incidence angles is analyzed by simultaneous implementation of the total-electron-yield (TEY) method and X-ray reflection spectroscopy. It is established that the effect of refraction on the TEY spectrum is greater than that of reflection and extends into the angular region up to angles 2θc. Within angles that are less than the critical angle, both the reflection and refraction strongly distort the shape of the TEY spectrum. Limitations of the technique for the calculation of optical constants from the reflection spectra using the Kramers-Kronig relation in the limited energy region in the vicinity of thresholds are discussed in detail.
Highlights
Progress in the development of new X-ray sources such as synchrotrons of the third and, in the nearest future, fourth generation and free-electron X-ray lasers in many respects determines the trends of development of atomic physics, condensed matter physics, chemical physics, materials science and physics interactions of high-frequency electromagnetic radiation with matter
Creating a super-high-resolution monochromator at soft X-ray wavelengths and electronic analyzers can significantly increase the informative character of the study of electronic and atomic structure and chemical bonding of polyatomic compounds by spectroscopy core levels (Stohr, 1992; de Groot & Kotani, 2008; Suga & Sekiyama, 2013), and makes these techniques indispensable tools for investigation in various fields of modern science and technology
We focus on the method developed by us (Filatova et al, 1999; Filatova et al, 2010) and based on the calculation of the absorption and refraction spectral dependencies from measured reflection spectra
Summary
Progress in the development of new X-ray sources such as synchrotrons of the third and, in the nearest future, fourth generation and free-electron X-ray lasers in many respects determines the trends of development of atomic physics, condensed matter physics, chemical physics, materials science and physics interactions of high-frequency electromagnetic radiation with matter. Fine structure of reflection spectra arising in the vicinity of absorption edges provides information about local (associated with a hole localization in the core shell) and partial (allowed for certain angular momentum symmetry) electronic density of states of the conduction band. This work is a first experimental attempt to clarify this problem Such an approach allows us to derive the absorption spectra from the reflection spectra over a wide angular region and to trace experimentally the evolution of the shape of measured and calculated TEY spectra with glancing angle simultaneously with the reflection spectra measured at the same angles. Such analysis makes it possible to find the. Angular region where absorption spectra do not feel the influence of reflection and refraction
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