Abstract
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices
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https://doi.org/10.1016/s0026-2714(01)00146-9
Journal: Microelectronics and Reliability | Publication Date: Sep 1, 2001 |
Citations: 6 |
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices
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