Abstract
The relationship between the molecular and crystalline structure and the dielectric response of hot-pressed PVDF film and the films cast from N,N-dimethylacetamide solution was studied by means of wide angle X-ray scattering, Raman and dielectric spectroscopy. We have found that the degree of crystallinity of hot-pressed PVDF is by about 10% higher than that of solution-cast films, which results in a decrease in the activation energy of segmental motions and a rise in the freezing temperature. We have also observed that the solution-cast samples are more reach in sequences containing trans conformation (T)nG with n ≥ 3 which leads to an increase in their permittivity value.
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