Abstract
(1−x)Na0.5Bi0.5TiO3–xK0.5Bi0.5TiO3 (NBT–KBT100x) (x=0.13, 0.15, 0.18, 0.20, 0.25) thin films were prepared by metal–organic decomposition, and the crystalline structures, surface morphologies, leakage current densities and dielectric, piezoelectric, and ferroelectric properties were investigated by X-ray diffractometer, scanning electron microscopy, semiconductor characterization system, scanning probe microscopy, and ferroelectric tester, respectively. The electrostrictive equation in phenomenological theory is used to model the piezoelectric and electrostriction behaviors of relaxor ferroelectric thin films, and the electrostriction coefficient couples effective piezoelectric coefficient with the polarization and relative permittivity. The electrostriction strains are larger than the piezoelectric strains for NBT–KBT100x thin films, and the electrostriction coefficients and electrostrictive strains are at the ranges of 0.019–0.025m4/C2 and 0.12%–0.26%, respectively. NBT–KBT15 thin film is of the largest electrostriction coefficient and electrostrictive strain, and it is attributed to the appropriate potassium content near morphotropic phase boundary and the equivalent energy for the phase coexistence. The results indicate that NBT-based thin film with high electrostrictive properties is a promising candidate for the application in electromechanical devices.
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