Abstract
Recrystallization of thin polycrystalline films of Au, Pt, and Pd obtained by thermal evaporation and condensation in a vacuum on silicon plates that are not warmed up and are coated on both sides with silicon oxide has been studied by transmission electron microscopy. It has been established that the rate of normal grain growth in such films is higher upon photon treatment by the radiation of power xenon lamps (spectral region of 0.2–1.2 μm) than upon heat treatment. A quantitative estimate of the effect revealed indicates a change in the mechanism of the process that controls migration of grain boundaries. The effect is connected with the possible activation of hypersonic waves owing to the coexistence of phonon and electron excitations localized in nanosized regions of metallic films.
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