Abstract
This research paper focuses on the effects of electromigration in integrated circuits at the nanoscale domain. This is an investigative work that shows how various process and parametric variation effects on electromigration. With integrated circuits reaching in the nanoscale domain, electromigration is becoming more of a prominent problem. Being able to find changes into the integrated circuits to provide a better electromigration performance is crucial for future emerging nanotechnologies. Therefore, this paper will go through previous research work to show the evolution of Black’s equation and see if Black’s equation could use on nanoscale integrated circuits. Also, it will be showing future iterations of the equation and comparing them with constant variables. Besides, a comparison of aluminum and copper interconnects and how electro migration happens differently are also discussing in this paper. Then a conclusion on how Black’s equation could use with nanoscale technologies to predict the time during the occurrence of electro migration.
Highlights
Introduction concept of electromigration shows inFigure 1
This paper will show a history of the findings of lectromigration is a phenomenon that has been around for almost a century. This concept will happen on an interconnect line segment that is under Constant use
Tu did a study on of an IC changed by a factor of 5. This show that grain electromigration in aluminum, copper, and solder joints boundaries need to consider when dealing with and compared the different electromigration effects on nanoscale cross-sectional areas in interconnecting their operating temperature of 100 °C [5]
Summary
Florida Polytechnic University Abstract- This research paper focuses on the effects of electromigration in integrated circuits at the nanoscale domain. This is an investigative work that shows how various process and parametric variation effects on electromigration. This paper will go through previous research work to show the evolution of Black’s equation and see if Black’s equation could use on nanoscale integrated circuits It will be showing future iterations of the equation and comparing them with constant variables. Abstract- This research paper focuses on the effects of electromigration in integrated circuits at the nanoscale domain With integrated circuits reaching in the nanoscale domain, electromigration is becoming more of a prominent problem
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