Effect of Nickel doping on the Structural, Optical, and electrical properties of titanium dioxide thin films for the application of sensing devices

Abstract

Thin films of pristine titanium dioxide (TiO2) and doped with different concentrations (0–8) at.% of nickel (Ni) were synthesized onto transparent glass substrates using the spray pyrolysis deposition technique. Field emission scanning electron microscopy revealed the porous and agglomerated surface morphology of the films. X-ray diffractometer demonstrated the anatase crystal structure with a nominal increment of (101) peak. The shifting of peak position revealed the expansion of the unit cell volume from 134.64 to 137.54 (Å)3 whereas crystallite size increased from 34 to 63 nm. Using the Fizeau fringes technique, the thickness of the films was determined between 165 and 190 nm. UV–Vis measurements were employed to examine the optical characteristics of the films. The red shift was observed for 2 at.% Ni content (3.38 eV) while the blue shift was observed for (4–8) at.% Ni content. The wavelength-dependent refractive index and dielectric constant showed anomalous dispersion in the absorption band, representing the transparency of the films. The 4-point probe measurement showed a decreasing trend of resistivity with increasing temperature, whereas the resistivity increased with Ni content. Activation energy indicated a higher amount of adsorbed oxygen in the films due to the high amount of Ni content.