Effect of multiple reflections on retardation-based electro-optic measurements

Abstract

The effect of multiple internal reflections on the (apparent) phase retardation exhibited by an electro-optic prism or plate is considered, along with the consequences of this effect on electro-optic measurements based on the measurements of retardation. The corresponding multiple-reflection errors are calculated and then thoroughly studied in the case of measurements of electro-optic coefficients r and half-wave voltages Vλ/2. Emphasis is given to the maximum values and upper bounds of these errors, and their maximization or minimization conditions are examined with respect to the testing voltage, the biasing voltage, and the optical thickness of the sample. Finally, the case of propagation along directions that ensure zero or canceled initial differential retardation (Γso = ±kπ) is treated distinctively and proves to present reduced mutliple-reflection errors.