Effect of Multiple Reflections on Accuracy of Electro-Optic Coefficient Measurements

Abstract

The intensity of a detected beam, taking into account multiple reflections occurring on the surface of a crystal rod, for a Mach–Zehnder interferometer, a Michelson interferometer and a Senarmont polarimeter has been derived. Using the derived equations, we analyzed the effect of multiple reflections in terms of the number of reflections on the surface, the static phase, and the refractive indices as well as the reflectivity of the random uniaxial crystals. Through the simulations, to realize high accuracy measurement and obtain reliable results with a low driving voltage, the careful treatment of the electro-optic sample is necessary.