Effect of minor Si addition on the creep of a fully lamellar TiAl alloy

Abstract

Considerable efforts have been made to improve the creep property of TiAl-based, two-phase alloys. While previous studies have demonstrated a beneficial effect of Si(0.25--1%) on the creep property of fully lamellar {gamma} alloys, the authors recently observed an opposite effect. That is, the addition of minor Si was found to be detrimental to the creep property of a fully lamellar TiAl in the present communication, the authors report this detrimental effect.