Effect of lanthanum oxide on the radiation-shielding, dielectric, and physical properties of lithium zinc phosphate glasses

Abstract

This study looked at the shielding properties, physical properties, and dielectric spectroscopy of various lanthanum oxide concentrations based on (65-x) P2O5-15 Li2O–15ZnO– 5Bi2O3- xLa2O3 with x = 0.0, 1.0, 2.0, 3.0, and 4.0 mol% glasses. When La2O3 is added, the molar volume quantities fall but the density values increase. The sample with the designation La-4.0 (4.0 mol% La2O3 content) had the highest density observed, 3.2182 g/cm3. Monte Carlo simulations and the Phy-x/PSD software were used to determine the critical gamma radiation attenuation characteristics, particularly linear attenuation coefficients and mass attenuation coefficients of glass samples under investigation. The half-value layer, mean free path, effective atomic number and effective electron density were then examined across a wide energy range (0.015–15 MeV). The findings of the investigation showed that the addition of La2O3 decreased the half-value layer and mean free path while increasing the mass attenuation coefficient, effective atomic number, and effective electron density. The results indicate that the inclusion of La2O3 appears to improve that glass system's ability to deflect gamma and neutron radiation. Over a broad frequency range, the dielectric properties were measured. The dielectric constant (ε′), which is typically steadily decreased with the addition of lanthanum, indicates an increase in the degree of electrical stiffness inside the glass network. Among the samples examined, the glass sample La-4.0 is thought to possess the best properties for electronic packaging due to its maximum propagation speed and lowest dielectric constant.