Abstract
A number of lamellar structures were produced in XD TiAl alloys (Ti-45 at. pct and 47 at. pct Al-2 at. pct Nb-2 at. pct Mn+0.8 vol pct TiB2) by selected heat treatments. During creep deformation, microstructural degradation of the lamellar structure was characterized by coarsening and spheroidization, resulting in the formation of fine globular structures at the grain boundaries. Grain boundary sliding (GBS) was thought to occur in local grains with a fine grain size, further accelerating the microstructural degradation and increasing the creep rate. The initial microstructural features had a great effect on microstructural instability and creep resistance. Large amounts of equiaxed γ grains hastened dynamic recrystallization, and the presence of fine lamellae increased the susceptibility to deformation-induced spheroidization. However, the coarsening and spheroidization were suppressed by stabilization treatments, resulting in better creep resistance than the microstructures without these treatments. Furthermore, well-interlocked grain boundaries with lamellar incursions were effective in restraining the onset of GBS and microstructural degradation. In the microstructures with smooth grain boundaries, a fine lamellar spacing significantly lowered the minimum creep rate but rapidly increased the tertiary creep rate for the 45 XD alloy. For the 47 XD alloy, well-interlocked grain boundaries dramatically improved the creep resistance of nearly and fully lamellar (FL) structures, in spite of the presence of coarse lamellar spacing or equiaxed γ grains. However, it may not be feasible to produce a microstructure with both a fine lamellar spacing and well-interlocked grain boundaries. If that is the case, it is suggested that the latter feature is more beneficial for creep resistance in XD TiAl alloys with relatively fine grains.
Published Version
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