Abstract
(100)/(001)-oriented epitaxial lead titanate (PbTiO3) films with various thicknesses were grown on (100) KTaO3 substrates by pulsed metal–organic chemical vapor deposition. The change of crystal structure with film thickness and deposition temperature was investigated. The paraelectric phase of 50 and 1000 nm-thick films had a tensile strain of 0.5% and almost 0% at 700 °C, respectively. The phase change temperature from the paraelectric phase to the ferroelectric phase, the Curie temperature (Tc), increased with the in-plane strain of the paraelectric phase; that is, Tc increased with decreasing film thickness. In contrast, room-temperature tetragonal distortion decreased as the film became thinner. This study reveals the effect of in-plane tensile strain in (100)/(001)-oriented epitaxial PbTiO3 films with higher Tc and smaller tetragonal distortion at room temperature.
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